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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
W
Formula:
WS
2
Name:
tungsten disulfide
CAS Registry No:
12138-09-9
Class:
catalyst, chalcogenide, IV-VI semiconductor, sulfide
Author Name(s):
Wagner C.D.
Journal:
J. Vac. Sci. Technol. 15, 518
DOI:
10.1116/1.569459
Pub Year:
1978
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-3d
5/2
, M
5
N
67
N
67
Auger Parameter (eV):
3536.20
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Cu,Au,AuM577=2015.8
Charge Reference:
Energy Scale Evaluation:
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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