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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ta
Formula:
Ta
Name:
tantalum
CAS Registry No:
7440-25-7
Class:
element
Author Name(s):
Wagner C.D., Taylor J.A.
Journal:
J. Electron Spectrosc. Relat. Phenom. 20, 83
DOI:
10.1016/0368-2048(80)85008-0
Pub Year:
1980
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-4f
7/2
, M
5
N
67
N
67
Auger Parameter (eV):
1696.60
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au 84.0,2015.7
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
sputtered
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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