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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
W
Formula:
WOx/W
XPS Formula:
W*Ox/W
Name:
tungsten oxides/tungsten
CAS Registry No:
Class:
non-stoichiometric oxide, oxide
Author Name(s):
Kojima I., Kurahashi M.
Journal:
J. Electron Spectrosc. Relat. Phenom. 42, 177
DOI:
10.1016/0368-2048(87)85018-1
Pub Year:
1987
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
7/2
Binding Energy (eV):
36.03
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
1.79
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, W4f7 = 31.37
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The total FWHM is 1.79 eV. Branching ratio = 0.78. Asymmetry parameter = 0.0.
Specimen:
native oxide
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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