NIST X-ray Photoelectron Spectroscopy Database

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Er/Si

silicon atoms in silicon rich ErSix

erbium/silicon

7440-21-3

cluster, element, IV semiconductor, silicide

Gokhale S., Mahamuni S., Deshmukh S.V., Rao V.J., Nigavekar A.S., and Kulkarni S.K.

Surf. Sci. 237, 127

Pub Year:

1990

Photoelectron Line

98.90

0.1

data

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1,2,5,10,15,40 A Er/Si(111), p-type. The rate of evaporation was monitored by aquartz crystal microbalance and was about 1A/min.