NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Si

(^-Si(CH₃)₂O^-)n

Si atoms bonded to three O atoms

poly(dimethyl siloxane)

CAS Registry No:

9016-00-6

organometallic, oxygen, polymer

Author Name(s):

Morra M., Occhiello E., Marola R., Garbassi F., Humphrey P., and Johnson D.

J. Colloid Interface Sci. 137, 11

Pub Year:

1990

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Total Records: 2

Photoelectron Line

Line Designation:

2p

Binding Energy (eV):

103.80

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

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