NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Element:

Formula:

Gd/Si

Name:

gadolinium/silicon (Casno: 7440-21-3)

CAS Registry No:

7440-21-3

Class:

element, IV semiconductor

Author Name(s):

Henle W.A., Netzer F.P., Cimino R., Braun W.

Journal:

Surf. Sci. 221, 131

DOI:

Pub Year:

1989

book All Records in this Publication

Chemical Shift

CS-2p

-0.65

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

140

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.8 nm Gd/Si(111)7x7, n-type. Gd coverages were measured with quartz film thickness monitor.

Specimen:

reacted, thin layer, vapor deposited, wafer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300