NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Formula:

[(CH₃)₄N]₂TcCl₆

XPS Formula:

[(CH₃)₄N*]₂TcCl₆

Name:

bis(tetramethylammonium) technetium(IV) hexachloride

CAS Registry No:

104716-19-0

Class:

chloride, nitrogen, organometallic, substituted ammonium

Author Name(s):

Thompson M., Nunn A.D., Treher E.

Journal:

Anal. Chem. 58, 3100

DOI:

Pub Year:

1986

book All Records in this Publication

Photoelectron Line

402.90

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

A gold mask and electron flood gun at a setting of 10 eV were used to control sample charging.

Specimen:

powder (when a special point is made in the article)

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300