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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
S
Formula:
-
C
6
H
2
S
2
-
XPS Formula:
-
C
6
H
2
S*
2
-
Name:
poly(thienothiophene)
CAS Registry No:
Class:
multiple rings, polymer, sulfur
Author Name(s):
Riga J., Snauwaert Ph., De Pryck A., Lazzaroni R., Boutique J.P., Verbist J.J. et al
Journal:
Synthetic Metals 21, 223
DOI:
10.1016/0379-6779(87)90090-7
Pub Year:
1987
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
163.90
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Gold
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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