NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Pd

Pd₈₄.₅Si₁₅.₅

Pd*₈₄.₅Si₁₅.₅

palladium silicon alloy (84.5-15.5)

CAS Registry No:

alloy

Doublet Separation for Photoelectron Lines

Line Designation:

DS-3d

Double Separation (eV):

5.31

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.53

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

1.0

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The samples have been prepared from ingots of a purity of 99.99% or higher. The constituents have been alloyed under UHV conditions in a Mo crucible which was Ar sputtered in order to achive a perfect wedding.The surface composition determined by XPS was determined by XPS was Pd82Si18.

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