NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

C

(^-CH₂C(CH₃)(C(O)OCH₃)^-)n

(^-CH₂C(CH₃)(C*(O)OCH₃)^-)n

poly(methyl methacrylate)

CAS Registry No:

9011-14-7

ester, oxygen, polymer, sulfur

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

288.60

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.3

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The film was baked in a vacuum oven (T = 348 K, time = 30 min) to remove solvent The C/O intensity ratio was 2.51. The relative intensity of this carbon state was 0.18. An electron flood gun (Ep = 2 eV, Ip = 0.5 microamps) was used for charge compensation

An error has occurred. This application may no longer respond until reloaded. Reload 🗙