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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Hg
Formula:
HgO
XPS Formula:
Hg*O
Name:
mercury(II) oxide
CAS Registry No:
21908-53-2
Class:
oxide
Author Name(s):
Humbert P.
Journal:
Solid State Commun. 60, 21
DOI:
10.1016/0038-1098(86)90007-4
Pub Year:
1986
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4s
Binding Energy (eV):
804.08
Energy Uncertainty:
0.20
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The metal oxygen/ratio derived from the Hg4f7/2 and O1s peak areas using the tabulated atomic sensitivity factors, was found to be 1.18.
Specimen:
crystal
Method of Determining Specimen Composition:
X-ray Diffraction
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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