NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

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O

(TiO₂)₈₂(SiO₂)₁₈

(SiO*₂)₁₈(TiO*₂)₈₂

titanium(IV) silicon(IV) oxide ((TiO2)82(SiO2)18)

CAS Registry No:

double oxide, oxide, silicate

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

530.00

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Mixed thin films of TiO2 and SiO2 were produced by coevaporation from separated electron beam sources and simultaneous bombardment of the growing film with oxygen ions.

amorphous, insulator, oxygen pressure, reaction by bombarding ions, vapor deposited

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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