NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 22

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

AlN₇OSi₅

101.60

AlN₇OSi₅

74.50

AlN₇OSi₅

532.20

AlN₇OSi₅

397.40

Al₂N₆O₂Si₄

101.70

Al₂N₆O₂Si₄

74.50

Al₂N₆O₂Si₄

532.00

Al₂N₆O₂Si₄

397.20

Al₃N₅O₃Si₃

101.70

Al₃N₅O₃Si₃

74.50

Al₃N₅O₃Si₃

531.80

Al₃N₅O₃Si₃

397.00

Al₄N₄O₄Si₂

101.70

Al₄N₄O₄Si₂

74.50

Al₄N₄O₄Si₂

531.60

Al₄N₄O₄Si₂

396.80

SiO₂

103.10

SiO₂

532.50

AlN

73.10

AlN

396.20

(MgO)₀.₀₄₇Si₃N₄

101.70

(MgO)₀.₀₄₇Si₃N₄

397.70

Photoelectron Line

74.50

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

2.5

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Argon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sialon was obtained by hot-pressing mixtures in the system Si3N4 and Al2O3.AlN at 2073 K for 1 h at a pressure of 20 MPa under 1 atm N2. The sample was cleaned by Ar+ ion bombardment (Ep = 400 eV, time = 200 s). No Ar+ ion-induced damage to the sample