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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
O
Formula:
O
2
/Ti
XPS Formula:
"O in Ti" solid solution or Ti
2
O
3
Name:
oxygen/titanium
CAS Registry No:
Class:
non-stoichiometric oxide, oxide
Author Name(s):
Kuznetsov M.V., Zhuravlev J.F., Gubanov V.A.
Journal:
J. Electron Spectrosc. Relat. Phenom. 58, 169
DOI:
10.1016/0368-2048(92)80016-2
Pub Year:
1992
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
531.30
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, Au4f7,Ti2p3 = 84.00, 453.98
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
5 L O2/Ti. The substrate was cleaned by Ar+ ion bombardment (Ep = 6 keV).
Specimen:
adsorbed, reacted, thin layer
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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