NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

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Element:

Formula:

SiC₁.₇

Name:

silicon carbide(SiC1.7)

CAS Registry No:

123968-95-6

Class:

carbide

Author Name(s):

Delplancke M.P., Powers J.M., Vandentop G.J., Salmeron M., Somorjai G.A.

Journal:

J. Vac. Sci. Technol. A 9, 450

DOI:

Pub Year:

1991

book All Records in this Publication

Photoelectron Line

100.30

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The film was prepared at 723 K.

Specimen:

chemical vapor deposition, crystal, thin film

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300