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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
N
Formula:
C
100
H
160
Br
4
CuN
12
/Si
XPS Formula:
quaternized nitrogen atoms
Name:
2,9,16,23-tetraoctadecyl-29H,31H-tetrapyridol[3,4-b:3',4'-g:3",4"-l:3''',4'''-q]porphyraziniumatocopper tetrabromide/silicon
CAS Registry No:
104574-70-1
Class:
bromide, nitrogen, organometallic, other ring, superconductor
Author Name(s):
Carniato S., Roulet H., Dufour G., Palacin S., Barraud A., Millie P., et al.
Journal:
J. Phys. Chem. 96, 7072
DOI:
10.1021/j100196a042
Pub Year:
1992
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
399.80
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Langmuir - Blodgett films with thicknesses of 3, 20, 45, and 100 ML. The relative intensity was 0.35. FAT mode.
Specimen:
crystal, multilayer, thin layer
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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