Overall Energy Resolution (eV):
0.7
Calibration:
Pt4f7 = 71.12
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
100 A Pt/p-type Si(100)-(2x1) with a resistivity of 3 ohm cm. The substrate was cleaned by annealing (T =1023 K, time = 20 min). Peak locations: Voigt function. The total FWHM is 1.2 eV. The thickness was measured using a quartz-crystal thickness monitor.
heated, thin layer, vapor deposited
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
623
