NIST X-ray Photoelectron Spectroscopy Database

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C₆H₅SH/Ni

benzenethiol/nickel

108-98-5

carbide, element, phenyl benzene, sulfur, thiol

Photoelectron Line

162.50

data

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, Ni3p3/2 = 66.08

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

0.16 ML (sulfur coverage) C6H5-SH/Ni(110). The substrate was cleaned by Ne+ ion bombardment and subsequently annealed (T = 1000 K, time = 60 s).

adsorbed, cooled, surface coverage from 0ML to 1ML (0ML < coverage < 1ML), thin layer

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

100