NIST X-ray Photoelectron Spectroscopy Database

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(^-O)₃Si(CH₂)₃NHC(O)(CH₂)₁₁NO₂/Si

(^-O)₃Si(CH₂)₃NHC*(O)(CH₂)₁₁NO₂/Si

12-nitro-N-propyldodecanamide covalently bonded to oxidized silicon

amide, nitrogen, organometallic, oxygen

Photoelectron Line

287.90

other

Gaussian

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The thickness of the film determined by ellipsometry is 25+-1 A. The relative intensity was 0.088. The spectra were recorded at normal emission.