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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
As
Formula:
As
Name:
arsenic
CAS Registry No:
7440-38-2
Class:
element
Author Name(s):
Cossu G., Ingo G.M., Mattogno G., Padeletti G., Proietti G.M.
Journal:
Appl. Surf. Sci. 56, 81
DOI:
10.1016/0169-4332(92)90219-N
Pub Year:
1992
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3d
Binding Energy (eV):
42.10
Energy Uncertainty:
0.1
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
For calibration, the CuL3M45M45 transition at 567.97 eV was also used.
Specimen:
semiconductor, solid sample mounted on tape
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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