NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

Formula:

C₄₆H₃₀Cl₂N₆O₄

XPS Formula:

carbon atoms attached to O

Name:

4,4'-[(3,3'-dichloro[1,1'-biphenyl]-4,4'-diyl)bis(azo)]bis[3-hydroxy-N-phenyl -2-naphthalenecarboxamide]

CAS Registry No:

41709-76-6

Class:

amide, azo, halogenated compound, multiple rings, nitrogen, phenyl benzene

Author Name(s):

Waltman R.J., Pacansky J., Bates C.W., Jr

Journal:

Chem. Mater. 5, 1799

DOI:

Pub Year:

1993

book All Records in this Publication

Photoelectron Line

287.90

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was C0.795N0.085O0.061Cl0.055. The film thickness was 2000 A. No radiation damage was detected. chlorodiane blue

Specimen:

cast film, thin film

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300