NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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O

(P₂O₅)₂₉.₇(SnO)₅₅.₃(ZnO)₁₅

non^-bridging oxygen atoms

diphosphorus pentoxide tin oxide zinc oxide ((P2O5)29.7(SnO)55.3(ZnO)15)

CAS Registry No:

glass, oxide

Author Name(s):

Onyiriuka E.C.

J. Non-cryst. Solids 163, 268

Pub Year:

1993

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

531.30

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared from ZnO, SnO, and NH4H2PO4 batch materials which were melted at 1273 K for 3 h and annealed at 573 K. The intensity ratio of the non-bridging/bridging oxygen components was 84.6/15.4.

amorphous, annealed, crushed, insulator, solid on double-sided tape

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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