NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

O

(Al₂O₃)₂.₀(K₂O)₇.₀(Li₂O)₆.₀(Na₂O)₇.₀(P₂O₅)₃₃(SiO₂)₂.₀(ZnO)₄₃

non^-bridging oxygen atoms

dialuminum trioxide dilithium oxide diphosphorus pentoxide dipotassium oxide silicon dioxide disodium oxide zinc oxide

CAS Registry No:

alkali, glass, oxide

Author Name(s):

Onyiriuka E.C.

J. Non-cryst. Solids 163, 268

Pub Year:

1993

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

532.00

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared from Al(PO3)3, NaPO3, Li2CO3, K2CO3, ZnO, SiO2, and NH4H2PO4 batch materials which were melted at 1273 K for 3 h and annealed at 573 K. The intensity ratio of the non-bridging/bridging oxygen components was 70/30.

amorphous, annealed, crushed, insulator, solid on double-sided tape

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙