NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

O

(P₂O₅)₄₀(ZnO)₆₀

non^-bridging oxygen atoms

diphosphorus pentoxide zinc oxide ((P2O5)40(ZnO)60)

CAS Registry No:

glass, oxide, phosphate

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

531.90

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by the reaction of analytical grade ZnO and phosphoric acid, calcining at 673 K overnight and then melted at 1373 K for 3 h. The sample was annealed at 573 K. The intensity ratio of the non-bridging/bridging oxygen components was 71.7/28.3.

An error has occurred. This application may no longer respond until reloaded. Reload 🗙