NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Si

MoSi₂

molybdenum disilicide

CAS Registry No:

12136-78-6

IV-VI semiconductor, silicide

Doublet Separation for Photoelectron Lines

Line Designation:

DS-2p

Double Separation (eV):

0.61

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

108 - 170

Overall Energy Resolution (eV):

0.23

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

MoSi2(110)-(1x1) and MoSi2(001)-(1x1). The single-crystals were grown in a floating-zone in a He atmosphere (pressure = 1 MPa). The Gaussian FWHM's were 0.29 eV and 0.31 eV for the excitation energies of 110 eV and 140 eV, respectively. Branching ratio = 0.5. Asymmetry parameter = 0.03.

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