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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ti
Formula:
TiS
2
Name:
titanium disulfide
CAS Registry No:
12039-13-3
Class:
chalcogenide, sulfide
Author Name(s):
Ettema A.R.H.F., Haas C.
Journal:
J. Phys. Cond. Matter 5, 3817
DOI:
10.1088/0953-8984/5/23/008
Pub Year:
1993
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3p
Binding Energy (eV):
35.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
3.0
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was synthesized by heating Ti with the correct amount of S for two weeks at 1173 K. The sample was cleaned by stripping with Scotch tape
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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