NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Be

Be

atoms of the third and fourth layer

beryllium

CAS Registry No:

7440-41-7

alkaline earth, element

Author Name(s):

Johansson H.I.P., Johansson L.I., Lundgren E., Andersen J.N., Nyholm R.

Phys. Rev. B 49, 17460

Pub Year:

1994

book All Records in this Publication

Surface Core-level Shift for the Third Layer of Atoms

Line Designation:

SS3-1s

Surface Core-Level Shift (eV) for the third Layer of Atoms:

-0.22

Energy Uncertainty:

0.03

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.24

Lorentzian Width (eV):

0.02

Use of X-ray Monochromator:

No

Anode Material:

other source

X-ray Energy:

123-180

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

beryllium

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Be(10-10). The Gaussian widths varied between 0.24 and 0.25 eV for the surface components and between 0.21 and 0.22 eV for the bulk component when photon energy changes between 123 and 180 eV. Asymmetry parameters are 0.02 and 0.06 for the bulk and surface peaks, respectively.

cooled, crystal, sputtered and heated

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

100

An error has occurred. This application may no longer respond until reloaded. Reload 🗙