NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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W

WS₃

surface oxide

tungsten trisulfide

CAS Registry No:

chalcogenide, sulfide

Author Name(s):

Khudorozhko G.F., Asanov I.P., Mazalov L.N., Kravtsova E.A., Parygina G.K., et al.

J. Electron Spectrosc. Relat. Phenom. 68, 199

Pub Year:

1994

book All Records in this Publication

Photoelectron Line

Line Designation:

4f_7/2

Binding Energy (eV):

35.30

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared from tetrathiotungstate ammonia by decomposition in vacuum by heating to 523 K. The surface was cleaned by Ar+ ion bombardment (Ep = 800 eV, Ip = 20 mA, time = 3 - 5 min). The intensity ratio of the high energy/low energy components was 0.50.

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