NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Zn

Cd₀.₅₄Zn₀.₄₆Se

cadmium zinc selenide

CAS Registry No:

157490-65-8

alkaline earth, chalcogenide, II-VI semiconductor, selenide

Author Name(s):

Wang M.W., Swenberg J.F., Miles R.J., Phillips M.C., Yu E.T., McCaldin J.O. et al

J. Cryst. Growth 138, 508

Pub Year:

1994

keyboard_arrow_downbookAll Records in this Publication

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 2

Photoelectron Line

Line Designation:

3p_3/2

Binding Energy (eV):

87.51

Energy Uncertainty:

0.04

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.56

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Peak locations: Voigt function.

An error has occurred. This application may no longer respond until reloaded. Reload 🗙