NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

VC₀.₈₀

vanadium carbide (VC0.80)

CAS Registry No:

carbide

Author Name(s):

Hakansson K.L., Johansson L.I., Hammar M., Gothelid M.

Phys. Rev. B 47, 10769

Pub Year:

1993

book All Records in this Publication

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS1-1s

Surface Core-Level Shift (eV) for the first Layer of Atoms:

-0.32

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.23

Lorentzian Width (eV):

0.19

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

300 - 450

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

VC0.80(111)-(8x1). The surface was cleaned by Ar+ ion bombardment and annealed to 1423 K for a few minutes to produce the 8x1 surface. The spectra were recorded at normal emission. Asymmetry parameter = 0.04. Asymmetry parameter = 0.04.

annealed, crystal, sputtered and heated

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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