Alexander V. Naumkin, Anna Kraut-Vass, Stephen W. Gaarenstroom,
and Cedric J. Powell
Angela Y. Lee
The NIST X-ray Photoelectron Spectroscopy (XPS) Database gives easy access to the energies of many photoelectron and Auger-electron spectral lines. Resulting from a critical evaluation of the published literature, the database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines. A highly interactive program allows the user to search by element, line type, line energy, and many other variables. Users can easily identify unknown measured lines by matching to previous measurements.
|NIST recently released a new version of the NIST Inorganic Crystal Structure Database (ICSD) SRD 3. For more information visit https://icsd.nist.gov
|May 19, 2021