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IUPAC-NIST Solubility Database
NIST Standard Reference Database 106
Solubility System:
Ethene with Nitric acid, Sodium Chloride and Water
Components:
(1) Ethene; C2H4; [74-85-1]
NIST Chemistry WebBook
for detail
(2) Water; H2O; [7732-18-5]
NIST Chemistry WebBook
for detail
(3) Nitric acid; HNO3; [7697-37-2]
NIST Chemistry WebBook
for detail
(4) Sodium chloride; NaCl; [7647-14-5]
NIST Chemistry WebBook
for detail
Original Measurements:
Onda, K.; Sada, E.; Kobayashi, T.; Kito, S.; Ito, K., J. Chem. Eng. Jpn. 1970, 3, 137-142.
Variables:
Temperature = 298.15 K
Pressure = 101.3 kPa
Prepared By:
C.L. Young
Experimental Remarks:
Pressure = 1 atmosphere = 1.01325 x 10
5
Pa.
Experimental Data:
(Subscripts 1,2,3, ..., in column headings refer to components 1,2,3, ...)
T/K
Concentration C
1
[mol L
1
]
Concentration Note
Concentration C
2
[mol L
1
]
Concentration Note
α [α]
α Note
Ionic Strength [mol L
1
]
Ionic Note
298.15
0.678
+ Sodium Chloride
0.424
+ Nitric Acid
0.0903
*
1.102
*
298.15
0.875
+ Sodium Chloride
0.546
+ Nitric Acid
0.0834
*
1.421
*
298.15
1.224
+ Sodium Chloride
0.744
+ Nitric Acid
0.0754
*
1.988
*
298.15
1.421
+ Sodium Chloride
0.887
+ Nitric Acid
0.0722
*
2.308
*
Notes:
*
quoted in original paper.
+
Calculated from ionic strength and statement in paper that ratio of ionic strength of sodium chloride to total ionic strength was 1:0.6156.
Method/Apparatus/Procedure:
Concentrated solution prepared by weighing, less concentrated solutions prepared by dilution. Equilibrium established between a measured volume of gas and a measured amount of gas-free liquid in a cell fitted with a magnetic stirrer. Amount of gas absorbed estimated from change in volume of gas. Details in source and Ref. 1.
Source and Purity of Materials:
1. Commercial sample, purity 99.6 mole per cent.
2. Analytical grade sample.
3. Analytical grade sample.
4. No information given.
Estimated Errors:
Solubility: δα = ± 2%. (estimated by compiler)
Temperature: δ
T
/K = ± 0.2 (estimated by compiler)
References:
1. Onda, K.; Sada, E.; Kobayashi, T.; Kito, S.; Ito, Y., J. Chem. Eng. Jpn. 1970, 3, 18.